• |Z|, L, C, R testing
• Testing source frequency: 4 Hz to 5 MHz
• Measuring time: 0.5 msec
• Measure LCR and conduct frequency sweeps simultaneously

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• |Z|, L, C, R testing
• Testing source frequency: 100kHz to 120MHz
• Measuring time: 6msec

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• |Z|, L, C, R testing
• Testing source frequency: 120Hz or 1kHz
• Measuring time: 5msec

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• C, D (tan δ), Q testing
• Measure low capacitance
• Testing source frequency: 1kHz, 1MHz
• Measuring time: 2msec
• RS-232C, GP-IB

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• C, D (tan δ), Q testing
• Measure high capacitance MLCC
• BIN function
• Contact check function
• Testing source frequency: 120Hz or 1kHz
• Measuring time: 2msec
• RS-232C, GP-IB

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• C, D (tan δ), Q testing
• Measure high capacitance MLCC
• BIN function
• Testing source frequency: 120Hz or 1kHz
• Measuring time: 2msec
• RS-232C, GP-IB

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• Ideal high speed resistance meter for automated lines
• Testing source: DC
• Fastest measurement time: 0.9ms
• Minimum integration time: 0.1ms
• Finest resolution: 0.1µΩ

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• The Perfect Battery Tester for the Production Line
• Testing source AC 1kHz
• Measure of High-voltage Battery Packs up to 300V
• Measurement time: 18ms
• Finest resolution 0.1µΩ and 10µV

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• The Perfect Battery Tester for the Production Line
• Testing source AC 1kHz
• Measure of High-voltage Battery Packs up to 60V
• Measurement time: 18ms
• Finest resolution 0.1µΩ and 10µV

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• The Perfect Battery Tester for the small secondary batteries
• Testing source AC 1kHz
• Measurement time: 10ms
• Finest resolution 0.01mΩ

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• For compact secondary batteries: check battery deterioration
• Testing source AC 1kHz
• Finest resolution 100µΩ

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